Patents/Inventors

Lubomir Tuma

BrnoCZ1 patent

2 Patents

US126092702026
Charged Particle Microscope for Examining a Specimen, and Method of Determining an Aberration of Said Charged Particle Microscope
FEI Company
0 cites
US120805122024
Charged Particle Microscope for Examining a Specimen, and Method of Determining an Aberration of Said Charged Particle Microscope
FEI Company
0 cites