Logan Jae Hwang

6 Patents

• US123927982025

  Socket Device for Testing ICS

  HICON CO., Ltd.

  0 cites
• US122480012025

  Lidless BGA Socket Apparatus for Testing Semiconductor Device

  HICON CO., Ltd.

  0 cites
• US120612122024

  Spring Contact and Socket Having Spring Contact Embedded Therein

  HICON CO., Ltd.

  0 cites
• US119826882024

  Spring Contact and Test Socket with Same

  HICON CO., Ltd.

  0 cites
• US116687442023

  Contact and Socket Device for Burning-in and Testing Semiconductor IC

  0 cites
• US115612412023

  Spring Contact and Test Socket with Same

  HICON CO., Ltd.

  0 cites