Patents/Inventors

Lior Yaron

Ness ZionaIL2 patents

3 Patents

US124566002025
Scanning Electron Microscopy-based Tomography of Specimens
Applied Materials Israel Ltd.
0 cites
US119210632024
Lateral Recess Measurement in a Semiconductor Specimen
Applied Materials Israel Ltd.
0 cites
US116623242023
Three-dimensional Surface Metrology of Wafers
Applied Materials Israel Ltd.
0 cites