Lihua Lei

3 Patents

• US123321952025

  Method for Calibrating Parameter Error of Electron Probe Microanalysis Instrument

  Tongji University

  0 cites
• US120009942024

  Optical Imaging Lens

  GENIUS ELECTRONIC OPTICAL (XIAMEN) CO., Ltd.

  0 cites
• US115794192023

  Optical Imaging Lens

  GENIUS ELECTRONIC OPTICAL (XIAMEN) CO., Ltd.

  0 cites