Patents/Inventors

Leendert Jan Karssemeijer

's HertogenboschNL3 patents

4 Patents

US126079462026
Metrology Method and Associated Metrology and Lithographic Apparatuses
ASML Netherlands B.V.
0 cites
US124614572025
Asymmetry Extended Grid Model for Wafer Alignment
ASML NETHERLANDS B.V.
0 cites
US121893142025
Metrology Method and Associated Metrology and Lithographic Apparatuses
ASML NETHERLANDS B.V.
0 cites
US120322992024
Metrology Method and Associated Metrology and Lithographic Apparatuses
ASML NETHERLANDS B.V.
0 cites