4 Patents
- US125679152026Method and Device for Processing Data Associated with a Model Characterizing a Propagation of Terahertz Radiation
HELMUT FISCHER GmbH INSTITUT FUER ELEKTRONIK UND MESSTECHNIK
0 cites - US125354112026Method and Device for Determining at Least One Property of at Least One Layer Using Terahertz Radiation
Helmut Fischer GmbH Institut Fuer Elektronik Und Messtechnik
0 cites - US121467332024Measuring Device and Method of Operating a Measuring Device
HELMUT FISCHER GmbH INSTITUT FÜR ELEKTRONIK UND MESSTECHNIK
0 cites - US120610772024Apparatus for Determining a Layer Thickness and Method of Operating Such Apparatus
Helmut Fischer GmbH Institut Fur Elektronik Und Messtechnik
0 cites