Patents/Inventors

Larry J. Koudele

Erie, COUS38 patents

42 Patents

US125666712026
Memory Device with Dynamic Processing Level Calibration
Micron Technology, Inc.
0 cites
US124230132025
Open Block Family Duration Limited by Temperature Variation
Micron Technology, Inc.
0 cites
US124242882025
Adjustment of Program Verify Targets Corresponding to a Last Programming Distribution and a Programming Distribution Adjacent to an Initial Programming Distribution
Micron Technology, Inc.
0 cites
US124171582025
Closing Block Family Based on Soft and Hard Closure Criteria
Micron Technology, Inc.
0 cites
US123071112025
Block Family-based Error Avoidance for Memory Devices
Micron Technology, Inc.
0 cites
US122930992025
Open Block Family Duration Limited by Time and Temperature
Micron Technology, Inc.
0 cites
US121414432024
Dynamic Temperature Compensation in a Memory Component
0 cites
US121255392024
Adjustment of a Starting Voltage Corresponding to a Program Operation in a Memory Sub-system
Micron Technology, Inc.
0 cites
US120400262024
Adjustment of Program Verify Targets Corresponding to a Last Programming Distribution and a Programming Distribution Adjacent to an Initial Programming Distribution
Micron Technology, Inc.
0 cites
US120012862024
Memory Device with Dynamic Processing Level Calibration
Micron Technology, Inc.
0 cites
US119408922024
Closing Block Family Based on Soft and Hard Closure Criteria
Micron Technology, Inc.
0 cites
US119412772024
Combination Scan Management for Block Families of a Memory Device
Micron Technology, Inc.
0 cites
US119346662024
Memory Device with Dynamic Program-verify Voltage Calibration
Micron Technology, Inc.
0 cites
US119230212024
Selection of Read Offset Values in a Memory Sub-system Based on Temperature and Time to Program Levels
Micron Technology, Inc.
0 cites
US119157762024
Error Avoidance Based on Voltage Distribution Parameters of Block Families
Micron Technology, Inc.
0 cites
US119085362024
First-pass Continuous Read Level Calibration
Micron Technology, Inc.
0 cites
US118867262024
Block Family-based Error Avoidance for Memory Devices
Micron Technology, Inc.
0 cites
US118535562023
Combining Sets of Memory Blocks in a Memory Device
Micron Technology, Inc.
0 cites
US118420612023
Open Block Family Duration Limited by Temperature Variation
Micron Technology, Inc.
0 cites
US118372912023
Voltage Offset Bin Selection by Die Group for Memory Devices
Micron Technology, Inc.
0 cites
US118171522023
Generating Embedded Data in Memory Cells in a Memory Sub-system
Micron Technology, Inc.
0 cites
US117896402023
Estimation of Read Level Thresholds Using a Data Structure
Micron Technology, Inc.
0 cites
US117554782023
Block Family Combination and Voltage Bin Selection
Micron Technology, Inc.
0 cites
US117420272023
Dynamic Program Erase Targeting with Bit Error Rate
Micron Technology, Inc.
0 cites
US117339292023
Memory System with Dynamic Calibration Using a Variable Adjustment Mechanism
Micron Technology, Inc.
0 cites
US117352542023
Error Avoidance Based on Voltage Distribution Parameters of Blocks
Micron Technology, Inc.
0 cites
US117279942023
Performing Threshold Voltage Offset Bin Selection by Package for Memory Devices
Micron Technology, Inc.
0 cites
US117213992023
Memory System with Dynamic Calibration Using a Trim Management Mechanism
Micron Technology, Inc.
0 cites
US117145802023
Dynamic Background Scan Optimization in a Memory Sub-system
Micron Technology, Inc.
0 cites
US117147102023
Providing Data of a Memory System Based on an Adjustable Error Rate
Micron Technology, Inc.
0 cites
US117042172023
Charge Loss Scan Operation Management in Memory Devices
Micron Technology, Inc.
0 cites
US117051932023
Error Avoidance Based on Voltage Distribution Parameters
Micron Technology, Inc.
0 cites
US117052082023
Read Level Calibration in Memory Devices Using Embedded Servo Cells
Micron Technology, Inc.
0 cites
US116755092023
Multiple Open Block Families Supporting Multiple Cursors of a Memory Device
Micron Technology, Inc.
0 cites
US116755112023
Associating Multiple Cursors with Block Family of Memory Device
Micron Technology, Inc.
0 cites
US116693802023
Dynamic Programming of Page Margins
Micron Technology, Inc.
0 cites
US116693982023
Memory Components with Ordered Sweep Error Recovery
Micron Technology, Inc.
0 cites
US116518282023
First-pass Dynamic Program Targeting (DPT)
Micron Technology, Inc.
0 cites
US116251772023
Combination Scan Management for Block Families of a Memory Device
Micron Technology, Inc.
0 cites
US116003332023
Adjustment of a Voltage Corresponding to a Programming Distribution Based on a Program Targeting Rule
Micron Technology, Inc.
0 cites
US115737202023
Open Block Family Duration Limited by Time and Temperature
Micron Technology, Inc.
0 cites
US115573572023
Selection of Read Offset Values in a Memory Sub-system
Micron Technology, Inc.
0 cites