Patents/Inventors

Lan-hsin Chiang

HsinchuTW2 patents

3 Patents

US123745882025
Method for Evaluating Non-uniform Stress
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites
US123241642025
Alignment Mark for MRAM Device and Method
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites
US118044102023
Thin-film Non-uniform Stress Evaluation
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites