2 Patents
- US119675032024Method of Depositing Thin Film and Method of Manufacturing Semiconductor Device Using the Same
WONIK IPS CO., Ltd.
0 cites - US117416072023Electronic Device, Method, and Computer Program for Calculating Bleeding Site and Trajectory of Bloodstain Scattered by Impact
REPUBLIC OF KOREA (NATIONAL FORENSIC SERVICE DIRECTOR MINISTRY OF THE INTERIOR AND SAFETY)
0 cites