Patents/Inventors

Kyong Hee Joo

SeoulKR2 patents

3 Patents

US120139182024
Method and Apparatus for Clustering Images
SAMSUNG SDS CO., Ltd.
0 cites
US118165792023
Method and Apparatus for Detecting Defect Pattern on Wafer Based on Unsupervised Learning
SAMSUNG SDS CO., Ltd.
0 cites
US115872222023
Method and Apparatus for Detecting Defect Pattern on Wafer Based on Unsupervised Learning
SAMSUNG SDS CO., Ltd.
0 cites