Patents/Inventors

Kyeongseon Yoo

Yongin-siKR1 patent

2 Patents

US121914562025
Battery Cell Leak Inspection Device and Battery Cell Leak Inspection Method
Samsung SDI Co., Ltd.
0 cites
US119161992024
Battery Cell Leak Inspection Device and Battery Cell Leak Inspection Method
Samsung SDI Co., Ltd.
0 cites