4 Patents
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- US124463042025Integrated Circuit Semiconductor Element Having Heterogeneous Gate Structures and Method of Fabricating Integrated Circuit Semiconductor Element
Samsung Electronics Co., Ltd.
0 cites - US123425212025Static Random-access Memory (SRAM) Device Including Three-dimensional Stacked (3DS) Field-effect Transistor (FET) and Layout Thereof
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US122299442025Defect Detection Method of Deep Learning-based Semiconductor Device and Semiconductor Element Manufacturing Method Including the Defect Detection Method
Samsung Electronics Co., Ltd.
0 cites