Patents/Inventors

Kwangrak Kim

Suwon-siKR3 patents

3 Patents

US125354332026
Focus Control Method for Spectroscopic Measuring Apparatus, Inspection Method for Semiconductor Device, and Spectroscopic Measuring Apparatus for Performing the Same
Samsung Electronics Co., Ltd.
0 cites
US122050402025
Method of Training Deep Learning Model for Predicting Pattern Characteristics and Method of Manufacturing Semiconductor Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US119468812024
Inspection Apparatus and Inspection Method Using Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites