6 Patents
- US125474872026Electronic System and Method of Managing Errors of the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US121303062024Module Substrate for Semiconductor Module, Semiconductor Module and Test Socket for Testing the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US120384732024Test Socket for Performing a Test on an Electronic Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - 0 cites
- US117929212023Module Substrate and Semiconductor Module Including the Same
Samsung Electronics Co., Ltd.
0 cites - US115932422023Method of Operating Storage Device for Improving Reliability, Storage Device Performing the Same and Method of Operating Storage Using the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites