8 Patents
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- US122159742025Optical Measurement Apparatus, Measuring Method Using the Same, and Method for Fabricating Semiconductor Device Using the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US120043532024Semiconductor Devices Including a Contact Structure That Contacts a Dummy Channel Structure
Samsung Electronics Co., Ltd.
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- US116597132023Semiconductor Devices Including a Contact Structure That Contacts a Dummy Channel Structure
Samsung Electronics Co., Ltd.
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