3 Patents
- US124493802025Defect Analysis Device and Defect Analysis Method Using the Same
Dongguk University Industry-academic Cooperation Foundation
0 cites - US122241742025Stacked Structure Including Semiconductor Structure and Method of Manufacturing the Same
INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY
0 cites - US118374682023Stacked Structure Including Semiconductor Structure and Method of Manufacturing the Same
INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY
0 cites