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Kuljit S. Virk
Fremont, CA
US
2 patents
3 Patents
US12298254
2025
System and Method for Reducing Sample Noise Using Selective Markers
KLA Corporation
0 cites
US12211196
2025
Ensemble of Deep Learning Models for Defect Review in High Volume Manufacturing
KLA Corp.
0 cites
US11922619
2024
Context-based Defect Inspection
KLA Corporation
0 cites