14 Patents
- US125987752026Source/drains in Semiconductor Devices and Methods of Forming Thereof
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US125060892025Semiconductor Structures with Improved Reliability
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US124396622025Diffusion Barrier Layer for Source and Drain Structures to Increase Transistor Performance
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US124262952025Rough Buffer Layer for Group III-V Devices on Silicon
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US123896332025Source/drains in Semiconductor Devices and Methods of Forming Thereof
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US123343892025Manufacturing Method of Semiconductor Device
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US122781392025Manufacturing Method of Semiconductor Device
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US122552322025Gallium Nitride Drain Structures and Methods of Forming the Same
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US121487062024Substrate Loss Reduction for Semiconductor Devices
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US119232372024Manufacturing Method of Semiconductor Device
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US119014132024Diffusion Barrier Layer for Source and Drain Structures to Increase Transistor Performance
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US118627202024Rough Buffer Layer for Group III-V Devices on Silicon
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US118240992023Source/drains in Semiconductor Devices and Methods of Forming Thereof
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites - US116520582023Substrate Loss Reduction for Semiconductor Devices
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites