Patents/Inventors

Kuang-shing Chen

HsinchuTW5 patents

5 Patents

US123873182025
Hot Spot Defect Detecting Method and Hot Spot Defect Detecting System
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites
US122432182025
Method and System for Scanning Wafer
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites
US119843652024
Semiconductor Structure Inspection Using a High Atomic Number Material
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites
US119005862024
Hot Spot Defect Detecting Method and Hot Spot Defect Detecting System
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites
US117834692023
Method and System for Scanning Wafer
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites