Patents/Inventors

Kuan-ying Lai

ChiayiTW2 patents

3 Patents

US121471632024
Method for Correcting Critical Dimension Measurements of Lithographic Tool
UNITED MICROELECTRONICS Corp.
0 cites
US119294182024
Metal Gate Structure and Method of Fabricating the Same
UNITED MICROELECTRONICS Corp.
0 cites
US118815182024
Metal Gate Structure and Method of Fabricating the Same
UNITED MICROELECTRONICS Corp.
0 cites