30 Patents
- US125849532026Semiconductor Testing Device and Method of Operating the Same
Taiwan Semiconductor Manufacturing Company, Ltd.
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- US124263332025Polysilicon Design for Replacement Gate Technology
TAIWAN SEMICONDUCOTR MANUFACTURING COMPANY, Ltd.
0 cites - US124143612025Method of Manufacturing a Semiconductor Device
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - 0 cites
- US123566582025Semiconductor Structure and Method of Forming the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US122726862025Semiconductor Structure and Manufacturing Method of the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US122612182025Semiconductor Structure and Method of Forming the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US122552072025Boundary Design for High-voltage Integration on HKMG Technology
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US122437872025Method of Forming Testing Module and Method for Using the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US122119262025Method and Related Apparatus for Reducing Gate-induced Drain Leakage in Semiconductor Devices
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US121913652025Thicker Corner of a Gate Dielectric Structure Around a Recessed Gate Electrode for an MV Device
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US121764072024Method of Forming a Transistor Device with a Gate Structure Having a Pair of Recess Regions and a Resistive Protection Layer Within
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US121007062024Semiconductor Structure and Method of Forming Thereof
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US120502452024Semiconductor Testing Device and Method of Operating the Same
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US120211402024Semiconductor Structure and Method of Forming Thereof
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
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- US118625922024Sidewall Spacer to Reduce Bond Pad Necking And/or Redistribution Layer Necking
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US118550912023Boundary Design for High-voltage Integration on HKMG Technology
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - 0 cites
- US118109732023Semiconductor Structure and Method of Forming Thereof
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US117990072023Thicker Corner of a Gate Dielectric Structure Around a Recessed Gate Electrode for an MV Device
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US117107122023Semiconductor Device and Manufacturing Method of the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US117054492023Through Silicon via Design for Stacking Integrated Circuits
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US116770222023Semiconductor Structure and Method of Forming Thereof
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US116463082023Through Silicon via Design for Stacking Integrated Circuits
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US116263982023Semiconductor Structure and Method for Manufacturing Thereof
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US115693632023Dishing Prevention Dummy Structures for Semiconductor Devices
Taiwan Semiconductor Manufacturing Company, Ltd.
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