Patents/Inventors

Kok Weng Wong

SingaporeSG1 patent

2 Patents

US119533122024
System and Method of Object Inspection Using Multispectral 3D Laser Scanning
MIT SEMICONDUCTOR (TIAN JIN) CO., Ltd
0 cites
US118252112023
Method of Color Inspection by Using Monochrome Imaging with Multiple Wavelengths of Light
MIT SEMICONDUCTOR (TIAN JIN) CO., Ltd
0 cites