4 Patents
- US125818732026Method of Manufacturing Sic Semiconductor Device and Sic Semiconductor Device
TOYOTA TSUSHO CORPORATION
0 cites - US125716262026Method for Measuring Etching Amount, and Measurement System Therefor
TOYOTA TSUSHO CORPORATION
0 cites - US122473192025Method for Producing a Sic Seed Crystal for Growth of a Sic Ingot by Heat-treating in a Main Container Made of a Sic Material
TOYOTA TSUSHO CORPORATION
0 cites - US120984762024Method for Producing a Sic Substrate via an Etching Step, Growth Step, and Peeling Step
TOYOTA TSUSHO CORPORATION
0 cites