8 Patents
- 0 cites
- US122822492025Full-chip Cell Critical Dimension Correction Method and Method of Manufacturing Mask Using the Same
Samsung Electronics Co., Ltd.
0 cites - 0 cites
- 0 cites
- 0 cites
- 0 cites
- 0 cites
- US115678792023Method of Encrypting Data in Nonvolatile Memory Device, Nonvolatile Memory Device and User Device
Samsung Electronics Co., Ltd.
0 cites