Patents/Inventors

Kishore Kumar Muchherla

San Jose, CAUS142 patents

151 Patents

US126145832026
Concurrent Scan Operation on Multiple Blocks in a Memory Device
Micron Technology, Inc.
0 cites
US126082752026
Multi-layer Code Rate Architecture for Copyback Between Partitions with Different Code Rates
Micron Technology, Inc.
0 cites
US125855832026
Multiple Write Programming for a Segment of a Memory Device
Micron Technology, Inc.
0 cites
US125610802026
Resequencing Data Programmed to Multiple Level Memory Cells at a Memory Sub-system
Micron Technology, Inc.
0 cites
US125486302026
Media Management Scanning with Unified Criteria to Alleviate Fast and Latent Read Disturb
Micron Technology, Inc.
0 cites
US125058972025
Program Refresh with Gate-induced Drain Leakage
Micron Technology, Inc.
0 cites
US124988862025
Buffer Allocation for Reducing Block Transit Penalty
MICRON TECHNOLOGY, Inc.
0 cites
US124988772025
Mitigating Slow Read Disturb in a Memory Sub-system
Micron Technology, Inc.
0 cites
US124814632025
Multiple-pass Programming of Memory Cells Using Temporary Parity Generation
MICRON TECHNOLOGY, Inc.
0 cites
US124618182025
Temporary Parity Buffer Allocation for Zones in a Parity Group
Micron Technology, Inc.
0 cites
US124565022025
Generating Semi-soft Bit Data During Corrective Read Operations in Memory Devices
Micron Technology, Inc.
0 cites
US124444532025
Volatile Data Storage in NAND Memory
Micron Technology, Inc.
0 cites
US124302582025
Padding Cached Data with Valid Data for Memory Flush Commands
Micron Technology, Inc.
0 cites
US124302432025
Using a Common Pool of Blocks for User Data and a System Data Structure
Micron Technology, Inc.
0 cites
US124230022025
Selectively Programming Retired Wordlines of a Memory Device
Micron Technology, Inc.
0 cites
US124170352025
Modified Read Counter Incrementing Scheme in a Memory Sub-system
Micron Technology, Inc.
0 cites
US123933632025
Voltage Bin Calibration Based on a Voltage Distribution Reference Voltage
Micron Technology, Inc.
0 cites
US123731092025
Validating Read Level Voltage in Memory Devices
Micron Technology, Inc.
0 cites
US123401262025
Workload-based Scan Optimization
Micron Technology, Inc.
0 cites
US123341422025
Sacrificial Strings in a Memory Device to Detect Read Disturb
Micron Technology, Inc.
0 cites
US123341532025
Adaptive Pre-read Management in Multi-pass Programming
MICRON TECHNOLOGY, Inc.
0 cites
US123327422025
Memory Compaction Management in Memory Devices
Micron Technology, Inc.
0 cites
US123270482025
Using Duplicate Data for Improving Error Correction Capability
Micron Technology, Inc.
0 cites
US123267822025
Adjustment of Code Rate as Function of Memory Endurance State Metric
Micron Technology, Inc.
0 cites
US123224502025
Memory Programming Using Consecutive Coarse-fine Programming Operations of Threshold Voltage Distributions
Micron Technology, Inc.
0 cites
US123071112025
Block Family-based Error Avoidance for Memory Devices
Micron Technology, Inc.
0 cites
US123070902025
Memory Device Programming Technique for Increased Bits per Cell
Micron Technology, Inc.
0 cites
US122993182025
Data Reordering at a Memory Subsystem
Micron Technolgy, Inc.
0 cites
US122993042025
Automatic Wordline Status Bypass Management
Micron Technology, Inc.
0 cites
US122930992025
Open Block Family Duration Limited by Time and Temperature
Micron Technology, Inc.
0 cites
US122664072025
Conditional Valley Tracking During Corrective Reads
Micron Technology, Inc.
0 cites
US122493642025
Apparatus with Non-linear Delay Variations for Scheduling Memory Refresh Operations and Methods for Operating the Same
Micron Technology, Inc.
0 cites
US122290002025
Managing Error-handling Flows in Memory Devices
Micron Technology, Inc.
0 cites
US122165732025
Memory Device with Dynamic Cache Management
Micron Technology, Inc.
0 cites
US122177992025
Parallelized Defect Detection Across Multiple Sub-blocks in a Memory Device
Micron Technology, Inc.
0 cites
US121701132024
Concurrent Programming of Retired Wordline Cells with Dummy Data
Micron Technology, Inc.
0 cites
US121423432024
Memory Devices for Multiple Read Operations
Micron Technology, Inc.
0 cites
US121423332024
Error Correction in a Memory Device Having an Error Correction Code of a Predetermined Code Rate
Micron Technology, Inc.
0 cites
US121310602024
Quick Charge Loss Mitigation Using Two-pass Controlled Delay
MICRON TECHNOLOGY, Inc.
0 cites
US121317882024
Read Counter Adjustment for Delaying Read Disturb Scans
MICRON TECHNOLOGY, Inc.
0 cites
US121310282024
Programming Selective Word Lines During an Erase Operation in a Memory Device
Micron Technology, Inc.
0 cites
US121059672024
Two-tier Defect Scan Management
Micron Technology, Inc.
0 cites
US121059612024
Copyback Clear Command for Performing a Scan and Read in a Memory Device
Micron Technology, Inc.
0 cites
US120997252024
Code Rate as Function of Logical Saturation
Micron Technology, Inc.
0 cites
US120860282024
Reduction of Errors in Data Retrieved from a Memory Device to Apply an Error Correction Code of a Predetermined Code Rate
Micron Technology, Inc.
0 cites
US120795172024
Buffer Allocation for Reducing Block Transit Penalty
MICRON TECHNOLOGY, Inc.
0 cites
US120738922024
Simplified Operations to Read Memory Cells Coarsely Programmed via Interleaved Two-pass Data Programming Techniques
Micron Technology, Inc.
0 cites
US120738912024
Integrated Command to Calibrate Read Voltage Level
Micron Technology, Inc.
0 cites
US120680342024
Two-pass Corrective Programming for Memory Cells That Store Multiple Bits and Power Loss Management for Two-pass Corrective Programming
MICRON TECHNOLOGY, Inc.
0 cites
US120672902024
On-die Cross-temperature Management for a Memory Device
Micron Technology, Inc.
0 cites
US120571852024
Voltage Calibration Scans to Reduce Memory Device Overhead
Micron Technology, Inc.
0 cites
US120514792024
Memory Block Programming Using Defectivity Information
MICRON TECHNOLOGY, Inc.
0 cites
US120263852024
Automatic Wordline Status Bypass Management
Micron Technology, Inc.
0 cites
US120195572024
Padding Cached Data with Valid Data for Memory Flush Commands
Micron Technology, Inc.
0 cites
US120090422024
Executing a Refresh Operation in a Memory Sub-system
Micron Technology, Inc.
0 cites
US120017212024
Multiple-pass Programming of Memory Cells Using Temporary Parity Generation
MICRON TECHNOLOGY, Inc.
0 cites
US119953262024
Selective Partitioning of Sets of Pages Programmed to Memory Device
Micron Technology, Inc.
0 cites
US119949472024
Multi-layer Code Rate Architecture for Special Event Protection with Reduced Performance Penalty
Micron Technology, Inc.
0 cites
US119901862024
One-ladder Read of Memory Cells Coarsely Programmed via Interleaved Two-pass Data Programming Techniques
Micron Technology, Inc.
0 cites
US119830672024
Adjustment of Code Rate as Function of Memory Endurance State Metric
MICRON TECHNOLOGY, Inc.
0 cites
US119785142024
Erase Cycle Healing Using a High Voltage Pulse
Micron Technology, Inc.
0 cites
US119777782024
Workload-based Scan Optimization
Micron Technology, Inc.
0 cites
US119666162024
Voltage Bin Calibration Based on a Voltage Distribution Reference Voltage
Micron Technology, Inc.
0 cites
US119607222024
Memory Device Programming Technique for Increased Bits per Cell
Micron Technology, Inc.
0 cites
US119421602024
Performing a Program Operation Based on a High Voltage Pulse to Securely Erase Data
Micron Technology, Inc.
0 cites
US119412852024
Mitigating Slow Read Disturb in a Memory Sub-system
Micron Technology, Inc.
0 cites
US119346862024
Data Reordering at a Memory Subsystem
Micron Technology, Inc.
0 cites
US119342662024
Memory Compaction Management in Memory Devices
Micron Technology, Inc.
0 cites
US119346892024
Word Line Group Read Counters
Micron Technology, Inc.
0 cites
US119283532024
Multi-page Parity Data Storage in a Memory Device
Micron Technology, Inc.
0 cites
US119283472024
Managing Voltage Bin Selection for Blocks of a Memory Device
Micron Technology, Inc.
0 cites
US119230212024
Selection of Read Offset Values in a Memory Sub-system Based on Temperature and Time to Program Levels
Micron Technology, Inc.
0 cites
US119220292024
Modified Read Counter Incrementing Scheme in a Memory Sub-system
Micron Technology, Inc.
0 cites
US119157852024
Memory Sub-system Management Based on Dynamic Control of Wordline Start Voltage
Micron Technology, Inc.
0 cites
US119144902024
Reactive Read Based on Metrics to Screen Defect Prone Memory Blocks
Micron Technology, Inc.
0 cites
US119157642024
Apparatus and Methods for Thermal Management in a Memory
Micron Technology, Inc.
0 cites
US119157762024
Error Avoidance Based on Voltage Distribution Parameters of Block Families
Micron Technology, Inc.
0 cites
US118999662024
Implementing Fault Tolerant Page Stripes on Low Density Memory Systems
Micron Technology, Inc.
0 cites
US118876512024
Temperature Informed Memory Refresh
Micron Technology, Inc.
0 cites
US118867262024
Block Family-based Error Avoidance for Memory Devices
Micron Technology, Inc.
0 cites
US118863362024
Managing Workload of Programming Sets of Pages to Memory Device
Micron Technology, Inc.
0 cites
US118696052024
Adjusting Pass-through Voltage Based on Threshold Voltage Shift
Micron Technology, Inc.
0 cites
US118686392024
Providing Recovered Data to a New Memory Cell at a Memory Sub-system Based on an Unsuccessful Error Correction Operation
MICRON TECHNOLOGY, Inc.
0 cites
US118612332024
Using Duplicate Data for Improving Error Correction Capability
Micron Technology, Inc.
0 cites
US118532052023
Memory Device with Dynamic Cache Management
Micron Technology, Inc.
0 cites
US118373072023
Managing Error-handling Flows in Memory Devices
Micron Technology, Inc.
0 cites
US118363922023
Relocating Data to Low Latency Memory
Micron Technology, Inc.
0 cites
US118292902023
Garbage Collection Candidate Selection Using Block Overwrite Rate
Micron Technology, Inc.
0 cites
US118296232023
Using Incomplete Super Blocks for Increased Write Performance
Micron Technology, Inc.
0 cites
US118292452023
Multi-layer Code Rate Architecture for Copyback Between Partitions with Different Code Rates
Micron Technology, Inc.
0 cites
US118237482023
Voltage Bin Calibration Based on a Temporary Voltage Shift Offset
Micron Technology, Inc.
0 cites
US118237222023
Determining Voltage Offsets for Memory Read Operations
MICRON TECHNOLOGY, Inc.
0 cites
US118106272023
Selective Read Disturb Sampling
Micron Technology, Inc.
0 cites
US118097292023
UFS Based Idle Time Garbage Collection Management
Micron Technology, Inc.
0 cites
US117974412023
Cache Media Management
Micron Technology, Inc.
0 cites
US117898622023
Power-on-time Based Data Relocation
Micron Technology, Inc.
0 cites
US117828472023
Performing a Media Management Operation Based on a Sequence Identifier for a Block
Micron Technology, Inc.
0 cites
US117839012023
Multi-tier Threshold Voltage Offset Bin Calibration
Micron Technology, Inc.
0 cites
US117826272023
Read Count Scaling Factor for Data Integrity Scan
Micron Technology, Inc.
0 cites
US117751812023
Read Error Recovery
Micron Technology, Inc.
0 cites
US117686192023
Voltage Based Combining of Block Families for Memory Devices
Micron Technology, Inc.
0 cites
US117627672023
Storing Highly Read Data at Low Impact Read Disturb Pages of a Memory Device
Micron Technology, Inc.
0 cites
US117565942023
Memory Devices for Multiple Read Operations
Micron Technology, Inc.
0 cites
US117554722023
Periodic Flush in Memory Component That Is Using Greedy Garbage Collection
Micron Technology, Inc.
0 cites
US117480132023
Grouping Blocks Based on Power Cycle and Power on Time
Micron Technology, Inc.
0 cites
US117409572023
Prioritization of Error Control Operations at a Memory Sub-system
Micron Technology, Inc.
0 cites
US117408052023
Selective Relocation of Data of a Subset of a Data Block Based on Distribution of Reliability Statistics
Micron Technology, Inc.
0 cites
US117352542023
Error Avoidance Based on Voltage Distribution Parameters of Blocks
Micron Technology, Inc.
0 cites
US117268672023
Multi-page Parity Protection with Power Loss Handling
Micron Technology, Inc.
0 cites
US117268742023
Storing Critical Data at a Memory System
Micron Technology, Inc.
0 cites
US117279942023
Performing Threshold Voltage Offset Bin Selection by Package for Memory Devices
Micron Technology, Inc.
0 cites
US117266892023
Time-based Combining for Block Families of a Memory Device
Micron Technology, Inc.
0 cites
US117204932023
Cache Management Based on Memory Device Over-provisioning
Micron Technology, Inc.
0 cites
US117202862023
Extended Cross-temperature Handling in a Memory Sub-system
Micron Technology, Inc.
0 cites
US117155472023
Scan Optimization Using Data Selection Across Wordline of a Memory Array
Micron Technology, Inc.
0 cites
US117096332023
Adjusting Scan Event Thresholds to Mitigate Memory Errors
Micron Technology, Inc.
0 cites
US117097272023
Managing Error-handling Flows in Memory Devices
Micron Technology, Inc.
0 cites
US117105272023
Mitigating a Voltage Condition of a Memory Cell in a Memory Sub-system
Micron Technology, Inc.
0 cites
US117042172023
Charge Loss Scan Operation Management in Memory Devices
Micron Technology, Inc.
0 cites
US117051922023
Managing Read Level Voltage Offsets for Low Threshold Voltage Offset Bin Placements
Micron Technology, Inc.
0 cites
US117051932023
Error Avoidance Based on Voltage Distribution Parameters
Micron Technology, Inc.
0 cites
US117041792023
Regression-based Calibration and Scanning of Data Units
Micron Technology, Inc.
0 cites
US116994912023
Double Interleaved Programming of a Memory Device in a Memory Sub-system
Micron Technology, Inc.
0 cites
US116988322023
Selective Sampling of a Data Unit During a Program Erase Cycle Based on Error Rate Change Patterns
Micron Technology, Inc.
0 cites
US116937742023
Selectively Utilizing a Read Page Cache Mode in a Memory Subsystem
MICRON TECHNOLOGY, Inc.
0 cites
US116937672023
Performing a Media Management Operation Based on Changing a Write Mode of a Data Block in a Cache
Micron Technology, Inc.
0 cites
US116884832023
Managing Block Retirement for Temporary Operational Conditions
Micron Technology, Inc.
0 cites
US116884732023
SLC Page Read
Micron Technology, Inc.
0 cites
US116824462023
Selective Wordline Scans Based on a Data State Metric
Micron Technology, Inc.
0 cites
US116766642023
Voltage Bin Selection for Blocks of a Memory Device After Power Up of the Memory Device
Micron Technology, Inc.
0 cites
US116755292023
Threshold Voltage Determination for Calibrating Voltage Bins of a Memory Device
Micron Technology, Inc.
0 cites
US116703812023
Read Voltage Calibration Based on Host IO Operations
Micron Technology, Inc.
0 cites
US116569312023
Selective Sampling of a Data Unit Based on Program/erase Execution Time
Micron Technology, Inc.
0 cites
US116449792023
Selective Accelerated Sampling of Failure- Sensitive Memory Pages
Micron Technology, Inc.
0 cites
US116369082023
Global-local Read Calibration
Micron Technology, Inc.
0 cites
US116358992023
SLC Cache Management
Micron Technology, Inc.
0 cites
US116200742023
Voltage Bin Calibration Based on a Voltage Distribution Reference Voltage
Micron Technology, Inc.
0 cites
US116106322023
NAND Temperature Data Management
Micron Technology, Inc.
0 cites
US116098462023
Managing Workload of Programming Sets of Pages to Memory Device
Micron Technology, Inc.
0 cites
US116054342023
Overwriting at a Memory System
Micron Technology, Inc.
0 cites
US115932612023
Memory Device with Dynamic Cache Management
Micron Technology, Inc.
0 cites
US115942922023
Power Loss Immunity in Memory Programming Operations
Micron Technology, Inc.
0 cites
US115930052023
Managing Voltage Bin Selection for Blocks of a Memory Device
Micron Technology, Inc.
0 cites
US115876392023
Voltage Calibration Scans to Reduce Memory Device Overhead
Micron Technology, Inc.
0 cites
US115876272023
Determining Voltage Offsets for Memory Read Operations
Micron Technology, Inc.
0 cites
US115737202023
Open Block Family Duration Limited by Time and Temperature
Micron Technology, Inc.
0 cites
US115617222023
Multi-page Parity Data Storage in a Memory Device
Micron Technology, Inc.
0 cites
US115564172023
Reduction of Errors in Data Retrieved from a Memory Device to Apply an Error Correction Code of a Predetermined Code Rate
Micron Technology, Inc.
0 cites
US115573572023
Selection of Read Offset Values in a Memory Sub-system
Micron Technology, Inc.
0 cites
US115440082023
Temperature Correction in Memory Sub-systems
Micron Technology, Inc.
0 cites
US115441882023
Memory Device with Dynamic Storage Mode Control
Micron Technology, Inc.
0 cites