11 Patents
- US124475782025Compensation for Substrate Doping in Edge Reconstruction for In-situ Electromagnetic Inductive Monitoring
Applied Materials, Inc.
0 cites - US122720472025Residue Measurement from Machine Learning Based Processing of Substrate Images
Applied Materials, Inc.
0 cites - US121699252024System Using Film Thickness Estimation from Machine Learning Based Processing of Substrate Images
Applied Materials, Inc.
0 cites - US121365742024Technique for Training Neural Network for Use in In-situ Monitoring During Polishing and Polishing System
Applied Materials, Inc.
0 cites - US120905992024Determination of Substrate Layer Thickness with Polishing Pad Wear Compensation
Applied Materials, Inc.
0 cites - US120573542024Trained Neural Network in In-situ Monitoring During Polishing and Polishing System
Applied Materials, Inc.
0 cites - US118477762023System Using Film Thickness Estimation from Machine Learning Based Processing of Substrate Images
Applied Materials, Inc.
0 cites - US118369132023Film Thickness Estimation from Machine Learning Based Processing of Substrate Images
Applied Materials, Inc.
0 cites - US117912242023Technique for Training Neural Network for Use in In-situ Monitoring During Polishing and Polishing System
Applied Materials, Inc.
0 cites - US117800472023Determination of Substrate Layer Thickness with Polishing Pad Wear Compensation
Applied Materials, Inc.
0 cites - US116580782023Using a Trained Neural Network for Use in In-situ Monitoring During Polishing and Polishing System
Applied Materials, Inc.
0 cites