35 Patents
- US126023282026Memory Device, System Including the Same, and Operating Method of Memory Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - 0 cites
- US125421692026Device, Operating Method, Memory Device, and CXL Memory Expansion Device
Samsung Electronics Co., Ltd.
0 cites - US125360702026Memory Device, Operating Method of Memory Device, and Memory System Including Memory Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US125058982025Memory Controller Managing Refresh Operation and Operating Method Thereof
Samsung Electronics Co., Ltd.
0 cites - 0 cites
- US124171432025Memory System, Method of Operating the Same, and Electronic System Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US123798552025Semiconductor Memory Device Including a Cyclic Redundancy Check Engine and Memory System Including the Same
Samsung Electronics Co., Ltd.
0 cites - US123546372025Memory Devices and Methods Thereof for Managing Row Hammer Events Therein
Samsung Electronics Co., Ltd.
0 cites - US123546892025Error Correction Code Circuit, Memory Device Including Error Correction Code Circuit, and Operation Method of Error Correction Code
Samsung Electronics Co., Ltd.
0 cites - US123474772025Integrated Circuit Memory Devices Having Efficient Row Hammer Management and Memory Systems Including the Same
Samsung Electronics Co., Ltd.
0 cites - 0 cites
- US123155592025Latch-based Storage Circuits Having Efficient Integrated Circuit Layouts
Samsung Electronics Co., Ltd.
0 cites - US122885782025Semiconductor Memory Device and Method of Operating the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US122369912025Memory Device Performing Refresh Operation and Method of Operating the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - 0 cites
- US122123392025Error Correction Circuit, Memory System, and Error Correction Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US121769192024Error Correction Code Circuit, Memory Device Including Error Correction Code Circuit, and Operation Method of Error Correction Code Circuit
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - 0 cites
- US120571842024Memory Systems Having Memory Devices Therein with Enhanced Error Correction Capability and Methods of Operating Same
Samsung Electronics Co., Ltd.
0 cites - US120207392024Memory Device for Reducing Row Hammer Disturbance, and a Method of Refreshing the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US119478102024Semiconductor Memory Device and Memory System Including the Same
Samsung Electronics Co., Ltd.
0 cites - 0 cites
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- US118417632023Semiconductor Memory Devices with ECC Engine Defect Determination Based on Test Syndrome, Test Parity, Expected Decoding Status and Received Decoding Status
Samsung Electronics Co., Ltd.
0 cites - US118296142023Semiconductor Memory Devices and Methods of Operating Semiconductor Memory Devices
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - 0 cites
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- US117266702023Methods of Operating Memory Controllers, Memory Controllers Performing the Methods and Memory Systems Including the Memory Controllers
Samsung Electronics Co., Ltd.
0 cites - US116892242023Error Correction Device and Method for Generating Syndromes and Partial Coefficient Information in a Parallel
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - 0 cites
- US116703542023Memory Device for Reducing Row Hammer Disturbance and a Method of Refreshing the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US116314482023Memory Device Performing Refresh Operation and Method of Operating the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US116148692023Controller for Preventing Uncorrectable Error in Memory Device, Memory Device Having the Same, and Operating Method Thereof
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US116054412023Memory Systems Having Memory Devices Therein with Enhanced Error Correction Capability and Methods of Operating Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites