11 Patents
- US124006912025Memory Device and Method for Training Per-pin Operation Parameters
Samsung Electronics Co., Ltd.
0 cites - US123944702025Semiconductor Chip Capable of Calibrating Bias Voltage Supplied to Write Clock Buffer Regardless of Process Variation and Temperature Variation, and Devices Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US123743832025Memory Device Adjusting Skew of Multi-phase Clock Signals, Memory Controller Controlling the Memory Device, and Operating Method of the Memory Device
Samsung Electronics Co., Ltd.
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- US121255532024Memory Device Performing Offset Calibration and Operating Method Thereof
SAMSUNG ELECTRONICS CO., Ltd.
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