Patents/Inventors

Keumsil Lee

Palo Alto, CAUS2 patents

3 Patents

US122887052025
FIB-SEM 3D Tomography for Measuring Shape Deviations of HAR Structures
Carl Zeiss SMT GmbH
0 cites
US122835042025
Contact Area Size Determination Between 3D Structures in an Integrated Semiconductor Sample
Carl Zeiss SMT GmbH
0 cites
US119159082024
Method for Measuring a Sample and Microscope Implementing the Method
Carl Zeiss SMT GmbH
0 cites