Patents/Inventors

Kensuke Hata

AichiJP2 patents

2 Patents

US125354322026
Manufacturing Method and Inspection Method of Semiconductor Device Including Obtaining an Image of the Device and Determining Defects of a Metal Electrode
DENSO CORPORATION
0 cites
US122552282025
Silicon Carbide Semiconductor Device and Method of Manufacturing Silicon Carbide Semiconductor Device
DENSO CORPORATION
0 cites