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Inventors
Kenji Yamasaki
Kyoto
JP
3 patents
3 Patents
US12613257
2026
Probe Assessment Method and SPM
SHIMADZU CORPORATION
0 cites
US12352779
2025
Scanning Probe Microscope and Method for Measuring Physical Quantity Using Scanning Probe Microscope
SHIMADZU CORPORATION
0 cites
US12306208
2025
Information Providing System, Server Device, and Analyzer
SHIMADZU CORPORATION
0 cites