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Inventors
Kenji Amaya
Tokyo
JP
1 patent
2 Patents
US12442738
2025
Crack Estimation Device, Failure Diagnosis Device, Crack Estimation Method, and Failure Diagnosis Method for Rotating Machine
MITSUBISHI ELECTRIC CORPORATION
0 cites
US12313601
2025
Crack Estimation Device and Crack Estimation Method
MITSUBISHI ELECTRIC CORPORATION
0 cites