Patents/Inventors

Kelvin Chan

San Ramon, CAUS34 patents

33 Patents

US126151052026
System and Method to Measure and Score Application Health via Correctable Errors
Cisco Technology, Inc.
0 cites
US125395302026
Throttle Valve and Foreline Cleaning Using a Microwave Source
Applied Materials, Inc.
0 cites
US125059882025
Plasma Chamber with Gas Cross-flow, Microwave Resonators and a Rotatable Pedestal for Multiphase Cyclic Deposition
Applied Materials, Inc.
0 cites
US124826412025
Printed Microwave Resonator for Measuring High Electron Density Plasmas
Applied Materials, Inc.
0 cites
US124222102025
Techniques and Device Structures Based Upon Directional Dielectric Deposition and Bottom-up Fill
Applied Materials, Inc.
0 cites
US124068372025
Reaction Cell for Species Sensing
Applied Materials, Inc.
0 cites
US123946702025
Nucleation-free Gap Fill ALD Process
Applied Materials, Inc.
0 cites
US123680242025
Methods and Apparatus for Processing a Substrate
APPLIED MATERIALS, Inc.
0 cites
US123259102025
Deposition of Conformal and Gap-fill Amorphous Silicon Thin-films
Applied Materials, Inc.
0 cites
US123004912025
Deposition of Semiconductor Integration Films
Applied Materials, Inc.
0 cites
US122822562025
Photoresist Deposition Using Independent Multichannel Showerhead
Applied Materials, Inc.
0 cites
US122285342025
Capacitive Sensor for Monitoring Gas Concentration
Applied Materials, Inc.
0 cites
US121921042025
Congestion Notification Reporting for a Responsive Network
Cisco Technology, Inc.
0 cites
US121319482024
Techniques for Void-free Material Depositions
Applied Materials, Inc.
0 cites
US120947072024
Plasma Enhanced CVD with Periodic High Voltage Bias
Applied Materials, Inc.
0 cites
US120126522024
Single Process Volume to Perform High-pressure and Low-pressure Processes with Features to Reduce Cross-contamination
Applied Materials, Inc.
0 cites
US119680382024
System and Method to Measure and Score Application Health via Correctable Errors
Cisco Technology, Inc.
0 cites
US119608262024
Managing a Sharing of Media Content Among Client Computers
Google LLC
0 cites
US119598682024
Capacitive Sensor for Monitoring Gas Concentration
Applied Materials, Inc.
0 cites
US119569782024
Techniques and Device Structure Based Upon Directional Seeding and Selective Deposition
Applied Materials, Inc.
0 cites
US119553312024
Method of Forming Silicon Nitride Films Using Microwave Plasma
Applied Materials, Inc.
0 cites
US119095222024
System and Method to Measure and Score Application Health via Correctable Errors
Cisco Technology, Inc.
0 cites
US118878562024
Enhanced Spatial ALD of Metals Through Controlled Precursor Mixing
APPLIED MATERIALS, Inc.
0 cites
US118861202024
Deposition of Semiconductor Integration Films
Applied Materials, Inc.
0 cites
US118435412023
Congestion Notification Reporting for a Responsive Network
Cisco Technology, Inc.
0 cites
US118173202023
CVD Based Oxide-metal Multi Structure for 3D NAND Memory Devices
Applied Materials, Inc.
0 cites
US117768052023
Selective Oxidation and Simplified Pre-clean
APPLIED MATERIALS, Inc.
0 cites
US117495642023
Techniques for Void-free Material Depositions
Applied Materials, Inc.
0 cites
US117027422023
Methods of Forming Nucleation Layers with Halogenated Silanes
Applied Materials, Inc.
0 cites
US116211602023
Doped and Undoped Vanadium Oxides for Low-k Spacer Applications
APPLIED MATERIALS, Inc.
0 cites
US115629022023
Hydrogen Management in Plasma Deposited Films
Applied Materials, Inc.
0 cites
US115629042023
Deposition of Semiconductor Integration Films
Applied Materials, Inc.
0 cites
US115519052023
Resonant Process Monitor
Intel Corporation
0 cites