2 Patents
- US125661432026Optical Inspection Systems with Pulsed Light Sources and Pulse Multiplexing
Applied Materials Israel Ltd.
0 cites - US119843302024Atomic Layer Etch and Deposition Processing Systems Including a Lens Circuit with a Tele-centric Lens, an Optical Beam Folding Assembly, or a Polygon Scanner
Lam Research Corporation
0 cites