6 Patents
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- US124494712025Method for Predicting Failure of Semiconductor Device, and Semiconductor Device
DENSO CORPORATION
0 cites - US123693392025Surface Treatment Method for Gallium Oxide-based Semiconductor Substrate and Semiconductor Device
MIRISE Technologies Corporation
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- US116770052023Semiconductor Device and Method for Manufacturing the Same
KABUSHIKI KAISHA TOYOTA CHUO KENKYUSHO
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