5 Patents
- 0 cites
- US122596612025Overlay Mark, Overlay Marking Method and Overlay Measuring Method
NEXCHIP SEMICONDUCTOR CORPORATION
0 cites - US122534962025Three-dimensional Continuous Scanning Laser Vibrometry for 3D or In-plane Vibration Measurements
UNIVERSITY OF MARYLAND, BALTIMORE COUNTY
0 cites - US121454262024Electric Valve and Thermal Management System
HANGZHOU SANHUA RESEARCH INSTITUTE CO., Ltd.
0 cites - USD10047792023Fingertip Oximeter0 cites