Katsumasa Fujita

4 Patents

• US126188342026

  Measurement Sample Preparation Method, Analysis Method, Reagent, and Reagent Kit

  NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY

  0 cites
• US125908862026

  Optical Microscope and Imaging Method

  KYOTO PREFECTURAL PUBLIC UNVERSITY CORPORATION

  0 cites
• US124427602025

  Optical Module and Multifocal Optical Device

  OSAKA UNIVERSITY

  0 cites
• US120664332024

  Method for Analyzing Test Substance, Analyzer, Training Method, Analyzer System, and Analysis Program

  NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY

  0 cites