Patents/Inventors

Katsuhiko Kawabata

TokyoJP2 patents

3 Patents

US123548622025
Method for Analyzing Metal Microparticles, and Inductively Coupled Plasma Mass Spectrometry Method
IAS, Inc
0 cites
US118375102023
Method for Analyzing Silicon Substrate
KIOXIA CORPORATION
0 cites
US115690812023
Method for Analyzing Metal Fine Particles, and Inductively Coupled Plasma Mass Spectrometry Method
IAS Inc.
0 cites