Patents/Inventors

Kasumi Okabe

Nagoya AichiJP2 patents

3 Patents

US120722732024
Measuring Method and Measuring Apparatus
Kioxia Corporation
0 cites
US118358542023
Imprint Device, Imprint Method, and Semiconductor Device Manufacturing Method
KIOXIA CORPORATION
0 cites
US115927412023
Imprinting Method, Semiconductor Device Manufacturing Method and Imprinting Apparatus
Kioxia Corporation
0 cites