6 Patents
- US125860042026Methods of Predicting Reliability Information of Storage Devices and Methods of Operating Storage Devices
Samsung Electronics Co., Ltd.
0 cites - US121977672025Operation Method of Storage Device Configured to Support Multi-stream
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US119283382024Method of Measuring Durability of Nonvolatile Memory Device and Method of Performing Wear-leveling in Storage Device Using the Same
Samsung Electronics Co., Ltd.
0 cites - US117155162023Nonvolatile Memory Device Including a Fast Read Page and a Storage Device Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US117155382023Memory System Processing Request Based on Inference and Operating Method of the Same
Samsung Electronics Co., Ltd.
0 cites - US116314662023Storage Device Performing Read Operation by Restoring ON Cell Count (OCC) from Power Loss Protection Area of Non-volatile Memory
Samsung Electronics Co., Ltd.
0 cites