3 Patents
- US125469852026Dark-field Confocal Microscopy Measurement Apparatus and Method Based on Aperture Scanning of Vortex Illumination
Harbin Institute Of Technology
0 cites - US122766152025Dark-field Confocal Microscopy Measurement Apparatus and Method Based on Multi-fractional Angular Momentum Demodulation
Harbin Institute Of Technology
0 cites - US122038672025Dark-field Confocal Microscopy Measurement Apparatus and Method Based on Differential Fractional Vortex Beam
Harbin Institute Of Technology
0 cites