Patents/Inventors

Kai-hsiung Chen

New TaipeiTW3 patents

3 Patents

US125542062026
Overlay Marks for Reducing Effect of Bottom Layer Asymmetry
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites
US117264132023
Overlay Marks for Reducing Effect of Bottom Layer Asymmetry
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites
US116563912023
Aperture Design and Methods Thereof
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites