5 Patents
- US125539442026Built-in Self Test Circuit for Measuring Performance of Clock Data Recovery and System-on-chip Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US122126452025Reset Synchronizing Circuit and Glitchless Clock Buffer Circuit for Preventing Start-up Failure, and IQ Divider Circuit
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US120687522024Digital Loop Filter of Low Latency and Low Operation and Clock Data Recovery Circuit Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US118049452023Reset Synchronizing Circuit and Glitchless Clock Buffer Circuit for Preventing Start-up Failure, and IQ Divider Circuit
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US117402702023Pattern Generator and Built-in-self Test Device Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites