Patents/Inventors

Justin Lloyd Kreuzer

Trumbull, CTUS13 patents

13 Patents

US125720832026
Intensity Order Difference Based Metrology System, Lithographic Apparatus, and Methods Thereof
ASML HOLDING N.V.
0 cites
US124052272025
Method for Region of Interest Processing for Reticle Particle Detection
ASML Holding N.V.
0 cites
US124055352025
Method for Filtering an Image and Associated Metrology Apparatus
ASML Netherlands B.V.
0 cites
US123990002025
Systems and Methods for Measuring Intensity in a Lithographic Alignment Apparatus
ASML Holding N.V.
0 cites
US123796552025
Contaminant Identification Metrology System, Lithographic Apparatus, and Methods Thereof
ASML Holding N.V.
0 cites
US122982572025
Monolithic Particle Inspection Device
ASML Netherlands B.V.
0 cites
US122164142025
Self-referencing Integrated Alignment Sensor
ASML Holding N.V.
0 cites
US121355052024
Spectrometric Metrology Systems Based on Multimode Interference and Lithographic Apparatus
ASML Holding N.V.
0 cites
US121241772024
Overlay Measurement System Using Lock-in Amplifier Technique
ASML Netherlands B.V.
0 cites
US119948082024
Lithographic Apparatus, Metrology Systems, Phased Array Illumination Sources and Methods Thereof
ASML Holding N.V.
0 cites
US119661692024
Lithographic Apparatus, Metrology Systems, Phased Array Illumination Sources and Methods Thereof
ASML Holding N.V.
0 cites
US118416282023
Apparatus for and Method of Sensing Alignment Marks
ASML Holding N.V.
0 cites
US116621982023
Optical Arrangement for an Inspection Apparatus
ASML Holding N.V.
0 cites