Patents/Inventors

Justin Lach

Portage, MIUS1 patent

2 Patents

US124223762025
Imaging Reflectometry for Inline Screening
KLA Corporation
0 cites
US123321822025
System for Automatic Diagnostics and Monitoring of Semiconductor Defect Die Screening Performance Through Overlay of Defect and Electrical Test Data
KLA Corporation
0 cites