Patents/Inventors

Jungmin Bak

Suwon-siKR13 patents

10 Patents

US125783622026
Test Devices and Systems That Utilize Efficient Test Algorithms to Evaluate Devices Under Test
Samsung Electronics Co., Ltd.
0 cites
US125301382026
Memory Control Device and Refresh Control Method Thereof
Samsung Electronics Co., Ltd.
0 cites
US124888272025
CXL Device and Operation Method of CXL Device
Samsung Electronics Co., Ltd.
0 cites
US124628872025
Memory Device Included in Memory System and Method for Detecting Fail Memory Cell Thereof
Samsung Electronics Co., Ltd.
0 cites
US124428422025
Test Devices and Systems That Utilize Efficient Test Algorithms to Evaluate Devices Under Test
Samsung Electronics Co., Ltd.
0 cites
US124312122025
Row Decoder Circuit, Memory Device and Memory System
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US123475102025
Bonding Defect Detection for Die-to-die Bonding in Memory Devices
Samsung Electronics Co., Ltd.
0 cites
US123080832025
Volatile Memory Devices and Methods of Operating Same to Improve Reliability
Samsung Electronics Co., Ltd.
0 cites
US122303122025
Memory Device and Defense Method Thereof
Samsung Electronics Co., Ltd.
0 cites
US122047722025
Memory Devices and Methods for Managing Use History
Samsung Electronics Co., Ltd.
0 cites