Jung Ywn Park

4 Patents

• US121468392024

  Deep Learning System Applicable for Quality Inspection by Learning Only Non-defective Manufactured Product Data and Control Method Thereof

  INTER X Co., Ltd.

  0 cites
• US121252642024

  Deep Learning-based Quality Inspection System Applicable to Injection Process and Control Method Thereof

  INTER X Co., Ltd.

  0 cites
• US120874212024

  Ai-based Product Surface Inspecting Apparatus and Method

  INTER X CO., Ltd.

  0 cites
• US120204782024

  Thermal Image-based Hybrid Object Detection Method Using YOLO Model and Object Tracking Technique

  INTER X Co., Ltd.

  0 cites