Jung Hyuk Lee

3 Patents

• US121487842024

  Image Sensor

  Samsung Electronics Co., Ltd.

  0 cites
• US116251882023

  Nonvolatile Memory Device Having Resistive Memory Cells and a Controller to Detect Fail Cells, and Electronic Device Including the Same

  Samsung Electronics Co., Ltd.

  0 cites
• US116003532023

  Test Method for Memory Device, Operation Method of Test Device Testing Memory Device, and Memory Device with Self-test Function

  Samsung Electronics Co., Ltd.

  0 cites