Jun Yeob Kim

3 Patents

• US125537122026

  Focus Optimization for Wafer Which Has Multi-peak Focus

  AUROS Technology, Inc

  0 cites
• US124746442025

  Device and Method for Overlay Measurement Which Control Focus Movement

  AUROS Technology, Inc.

  0 cites
• US118681992024

  System for Detecting Anomaly and Method for Setting Threshold Thereof

  SEOUL NATIONAL UNIVERSITY R&DS FOUNDATION

  0 cites