Jun-xiu Liu

6 Patents

• US123263972025

  In-situ Apparatus for Detecting Abnormality in Process Tube

  Taiwan Semiconductor Manufacturing Co., Ltd.

  0 cites
• US122964282025

  Chemical Mechanical Polishing Apparatus and Method

  TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.

  0 cites
• US121900362025

  Method and System for Semiconductor Wafer Defect Review

  Taiwan Semiconductor Manufacturing Co., Ltd.

  0 cites
• US120621662024

  Method and System for Diagnosing a Semiconductor Wafer

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites
• US119357222024

  Machine Learning on Wafer Defect Review

  Taiwan Semiconductor Manufacturing Co., Ltd.

  0 cites
• US118164112023

  Method and System for Semiconductor Wafer Defect Review

  Taiwan Semiconductor Manufacturing Co., Ltd.

  0 cites